XPS, PHI VersaProbe II


147 Stepan Chemistry Hall


  • Monochromatic X-ray beam focusable to 9 µm spot size (no satellite peaks, high spatial resolution)
  • Modes of operation:
    • General XPS spectrum
    • Element scan
    • Line scan
    • Element or chemical state map
    • Depth profile
    • Angle-resolved spectra
  • Microscope for coarse sample positioning
  • X-ray induced secondary electrons imaging for fine sample positioning
  • Argon ion gun for sample cleaning or depth profiling 
  • High pressure gas cell for sample activation and catalysis

Typical Use

  • Surface elemental analysis
  • Oxidation state of surface elements
  • Surface transformation during gas phase activation and catalysis

Internal Hourly Rates

  • Unassisted: $41
  • Assisted: $83

External Hourly Rates

  • Unassisted: $80
  • Assisted: $141

Internal Daily Rates

  • Unassisted: $246

View Examples of Results