XPS
XPS, PHI VersaProbe II
Location
147 Stepan Chemistry Hall
Capabilities
- Monochromatic X-ray beam focusable to 9 µm spot size (no satellite peaks, high spatial resolution)
- Modes of operation:
- General XPS spectrum
- Element scan
- Line scan
- Element or chemical state map
- Depth profile
- Angle-resolved spectra
- X-ray induced secondary electrons imaging for fine sample positioning
- Argon ion gun for sample cleaning or depth profiling
- High pressure gas cell for sample activation and catalysis
- Bandgap analysis by UPS (ultraviolet photoelectron spectroscopy) and LEIPS (low energy inverse photoelectron spectroscopy)
Typical Use
- Surface elemental analysis
- Oxidation state of surface elements
- Surface transformation during gas phase activation and catalysis
Internal Hourly Rates
- Unassisted: $39
- Assisted: $100
External Hourly Rates
- Unassisted: $84
- Assisted: $170
Daily Rates
- Internal Unassisted: $234
- External Assisted: $504
