Notre Dame Researchers! Please join the Materials Characterization Facility (MCF) for a workshop focused on the quantitative analysis of X-Ray Diffraction (XRD) data, including the Rietveld method. All students (graduate and undergraduate) and postdoctoral associates are encouraged to attend.

Why attend?

• To impress your PI and reviewers with high quality data and analysis.
• To learn more about your samples.
• To meet other researchers on campus.
• To enjoy light refreshments, including Rise'n Roll donuts!

RSVP

Please email Dr. Ian Lightcap, Research and Facilities Program Director at ND Energy, to express your interest before January 26.